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Depth profiling of light-Z elements with elastic resonances: Oxygen profiling with the 3.045 MeV 16O(α, α)16O resonance

Depth profiling of light-Z elements with elastic resonances: Oxygen profiling with the 3.045 MeV 16O(α, α)16O resonance

W. De Coster; B. Brijs; J. Goemans; W. Vandervorst
  • 作者W. De Coster; B. Brijs; J. Goemans; W. Vandervorst
  • 卷第66卷
  • 印刷ISSN0168-583X
  • 文件大小651.67KB
  • 发表时间1992
  • DOI10.1016/0168-583x(92)96165-u
  • 页码283-291
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