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[IEEE Workshop Record 1992 IEEE Radiation Effects Data Workshop - New Orleans, LA, USA (14 July 1992)] Workshop Record 1992 IEEE Radiation Effects Data Workshop - Ionizing radiation effects on commercial 256 K EEPROM's

[IEEE Workshop Record 1992 IEEE Radiation Effects Data Workshop - New Orleans, LA, USA (14 July 1992)] Workshop Record 1992 IEEE Radiation Effects Data Workshop - Ionizing radiation effects on commercial 256 K EEPROM's

Bumbaugh, M.E.; Rosario, D.S.

作者Bumbaugh, M.E.; Rosario, D.S.
文件大小552.14KB
发表时间1992
DOI10.1109/REDW.1992.247326
页码42-47

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