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[IEEE Workshop Record 1992 IEEE Radiation Effects Data Workshop - New Orleans, LA, USA (14 July 1992)] Workshop Record 1992 IEEE Radiation Effects Data Workshop - 1 mu m CMOS gate array radiation hardened technology

[IEEE Workshop Record 1992 IEEE Radiation Effects Data Workshop - New Orleans, LA, USA (14 July 1992)] Workshop Record 1992 IEEE Radiation Effects Data Workshop - 1 mu m CMOS gate array radiation hardened technology

Owens, A.H.; Yee, A.; Toutounchi, S.; Lyu, M.; Schneider, W.C.; Dantas, A.R.V.

作者Owens, A.H.; Yee, A.; Toutounchi, S.; Lyu, M.; Schneider, W.C.; Dantas, A.R.V.
文件大小354.62KB
发表时间1992
DOI10.1109/REDW.1992.247322
页码67-71

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