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[IEEE Workshop Record 1992 IEEE Radiation Effects Data Workshop - New Orleans, LA, USA (14 July 1992)] Workshop Record 1992 IEEE Radiation Effects Data Workshop - Heavy ion test results on memories

[IEEE Workshop Record 1992 IEEE Radiation Effects Data Workshop - New Orleans, LA, USA (14 July 1992)] Workshop Record 1992 IEEE Radiation Effects Data Workshop - Heavy ion test results on memories

Ecoffet, R.; Labrunee, M.; Duzellier, S.; Falguere, D.

作者Ecoffet, R.; Labrunee, M.; Duzellier, S.; Falguere, D.
文件大小553.72KB
发表时间1992
DOI10.1109/redw.1992.247328
页码27-33

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