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[IEEE Workshop Record 1992 IEEE Radiation Effects Data Workshop - New Orleans, LA, USA (14 July 1992)] Workshop Record 1992 IEEE Radiation Effects Data Workshop - QML qualified 256 K radiation-hardened CMOS SRAM

[IEEE Workshop Record 1992 IEEE Radiation Effects Data Workshop - New Orleans, LA, USA (14 July 1992)] Workshop Record 1992 IEEE Radiation Effects Data Workshop - QML qualified 256 K radiation-hardened CMOS SRAM

Brown, R.; Damato, J.; Haddad, N.; Posey, B.; Scott, T.; Murrill, S.; Groseth, J.; McGregor, S.
  • 作者Brown, R.; Damato, J.; Haddad, N.; Posey, B.; Scott, T.; Murrill, S.; Groseth, J.; McGregor, S.
  • 文件大小443.13KB
  • 发表时间1992
  • DOI10.1109/redw.1992.247321
  • 页码72-81
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