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[IEEE Comput. Soc. Press [1992] International Conference on Wafer Scale Integration - San Francisco, CA, USA (22-24 Jan. 1992)] [1992] Proceedings International Conference on Wafer Scale Integration - An enhanced one-step C-testable design of two-dimensional iterative logic arrays

[IEEE Comput. Soc. Press [1992] International Conference on Wafer Scale Integration - San Francisco, CA, USA (22-24 Jan. 1992)] [1992] Proceedings International Conference on Wafer Scale Integration - An enhanced one-step C-testable design of two-dimensional iterative logic arrays

Kim, J.H.; Sung, H.

作者Kim, J.H.; Sung, H.
文件大小532.80KB
发表时间1992
DOI10.1109/icwsi.1992.171825
页码331-340

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