Gap junctions formed by connexins 26 and 32 alone and in combination are differently affected by applied voltage.
- 期刊名称Proceedings of the National Academy of Sciences
- 作者Barrio, L. C.; Suchyna, T.; Bargiello, T.; Xu, L. X.; Roginski, R. S.; Bennett, M. V.; Nicholson, B. J.
- 卷第89卷
- 期第9期
- 印刷ISSN0027-8424
- 电子ISSN1091-6490
- 文件大小194.13KB
- 发表时间1992-05-01
- DOI10.1073/pnas.89.9.4220-b
- 页码4220-4220
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