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Correction: Gap Junctions Formed by Connexins 26 and 32 Alone and in Combination are Differently Affected by Applied Voltage

Correction: Gap Junctions Formed by Connexins 26 and 32 Alone and in Combination are Differently Affected by Applied Voltage

Luis C. Barrio, Thomas Suchyna, Thaddeus Bargiello, Lie Xian Xu, Raymond S. Roginski, Michael V. L. Bennett and Bruce J. Nicholson
  • 期刊名称Proceedings of the National Academy of Sciences of the United States of America
  • 作者Luis C. Barrio, Thomas Suchyna, Thaddeus Bargiello, Lie Xian Xu, Raymond S. Roginski, Michael V. L. Bennett and Bruce J. Nicholson
  • 卷第89卷
  • 期第9期
  • 印刷ISSN0027-8424
  • 文件大小238.26KB
  • 发表时间1992-05-1
  • DOI10.2307/2359842
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