SPIE Proceedings [SPIE Rochester - DL tentative - Rochester, NY (Tuesday 1 October 1991)] International Competitiveness and Business Techniques in Advanced Optics and Imaging - Beyond the technology lists: tracking advanced optics and other critical technologies
- 作者Sternberg, Ernest; Sternberg, Ernest; Krisiloff, Allen J.; Schindler, Roland R.
- 卷第1617卷
- 印刷ISSN0277-786X
- 文件大小430.02KB
- 发表时间1992
- DOI10.1117/12.58904
- 页码26-34
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