SPIE Proceedings [SPIE SPIE's 1992 Symposium on Process Control and Monitoring - Somerset, NJ (Sunday 22 March 1992)] Optically Based Methods for Process Analysis - Development and characterization of a miniature dual-channel spectrometer for spectrocolorimetry

Oana, Harry J.; Jahreiss, Lothar; Rich, Danny C.; Trost, Stephan; Bomse, David S.; Brittain, Harry; Farquharson, Stuart; Lerner, Jeremy M.; Rein, Alan J.; Sohl, Cary; Todd, Terry R.; Weyer, Lois

作者Oana, Harry J.; Jahreiss, Lothar; Rich, Danny C.; Trost, Stephan; Bomse, David S.; Brittain, Harry; Farquharson, Stuart; Lerner, Jeremy M.; Rein, Alan J.; Sohl, Cary; Todd, Terry R.; Weyer, Lois
卷第1681卷
印刷ISSN0277-786X
文件大小1762.02KB
发表时间1992
DOI10.1117/12.137733
页码12-28

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SPIE Proceedings [SPIE SPIE's 1992 Symposium on Process Control and Monitoring - Somerset, NJ (Sunday 22 March 1992)] Optically Based Methods for Process Analysis - Development and characterization of a miniature dual-channel spectrometer for spectrocolorimetry