Electromigration: Investigation of heterogeneous systems
- 作者B. Vanhecke; L. De Schepper; W. De Ceuninck; V. D'Haeger; M. D'Olieslaegers; E. Beyne; J. Roggen; L. Stals
- 卷第33卷
- 期第8期
- 印刷ISSN0026-2714
- 文件大小658.72KB
- 发表时间1993
- DOI10.1016/0026-2714(93)90344-x
- 页码1141-1157