Auger electron spectroscopy, low energy electron diffraction and electron energy loss spectroscopy studies of Se overlayers grown on Cu(111) surfaces
Seiichi Nagashima; Iwao Ogura
- 作者Seiichi Nagashima; Iwao Ogura
- 卷第228卷
- 印刷ISSN0040-6090
- 文件大小402.92KB
- 发表时间1993
- DOI10.1016/0040-6090(93)90565-7
- 页码64-67