Temperature effects on radiation damage to silicon detectors
E. Barberis; J.G. Boissevain; N. Cartiglia; J.A. Ellison; P. Ferguson; J.K. Fleming; K. Holzscheiter; S. Jerger; D. Joyce; J.S. Kapustinsky; J. Leslie; C. Lietzke; J.A.J. Matthews; A.P.T. Palounek; D. Pitzl; W.A. Rowe; H.F.-W. Sadrozinski; D. Skinner; W.F. Sommer; W.E. Sondheim; S.J. Wimpenny; H.J. Ziock
- 作者E. Barberis; J.G. Boissevain; N. Cartiglia; J.A. Ellison; P. Ferguson; J.K. Fleming; K. Holzscheiter; S. Jerger; D. Joyce; J.S. Kapustinsky; J. Leslie; C. Lietzke; J.A.J. Matthews; A.P.T. Palounek; D. Pitzl; W.A. Rowe; H.F.-W. Sadrozinski; D. Skinner; W.F. Sommer; W.E. Sondheim; S.J. Wimpenny; H.J. Ziock
- 卷第326卷
- 印刷ISSN0168-9002
- 文件大小486.03KB
- 发表时间1993
- DOI10.1016/0168-9002(93)90379-v
- 页码373-380