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[IEEE Comput. Soc. Press 1993 International Conference on Computer Aided Design (ICCAD) - Santa Clara, CA, USA (7-11 Nov. 1993)] Proceedings of 1993 International Conference on Computer Aided Design (ICCAD) - Fault-based automatic test generator for linear analog circuits

[IEEE Comput. Soc. Press 1993 International Conference on Computer Aided Design (ICCAD) - Santa Clara, CA, USA (7-11 Nov. 1993)] Proceedings of 1993 International Conference on Computer Aided Design (ICCAD) - Fault-based automatic test generator for linear analog circuits

Nagi, N.; Chatterjee, A.; Balivada, A.; Abraham, J.A.

作者Nagi, N.; Chatterjee, A.; Balivada, A.; Abraham, J.A.
文件大小348.00KB
发表时间1993
DOI10.1109/iccad.1993.580036
页码88-91

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