发现好书期刊，享受阅读乐趣

海量图书期刊资源，随时随地畅享阅读乐趣

[IEEE IEEE International Test Conference - (ITC) - Baltimore, MD, USA (17-21 Oct. 1993)] Proceedings of IEEE International Test Conference - (ITC) - VINCI: Secure test of a VLSI high-speed encryption system

Bonnenberg, H.; Curiger, A.; Felber, N.; Kaeslin, H.; ZImmermann, R.; Fichtner, W.

作者Bonnenberg, H.; Curiger, A.; Felber, N.; Kaeslin, H.; ZImmermann, R.; Fichtner, W.
文件大小811.32KB
发表时间1993
DOI10.1109/test.1993.470624
页码782-790