[IEEE 1993 IEEE Radiation Effects Data Workshop - Snowbird, UT, USA (21 July 1993)] 1993 IEEE Radiation Effects Data Workshop - Radiation Damage And Grain Boundary Effects In High-T, Microwave Devices And Tunnel Junctions
Weaver, B.D.; Jackson, E.M.; Summers, G.P.
- 作者Weaver, B.D.; Jackson, E.M.; Summers, G.P.
- 文件大小450.56KB
- 发表时间1993
- DOI10.1109/redw.1993.700575
- 页码107-111