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[IEEE Comput. Soc. Press Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium - Atlantic City, NJ, USA (6-8 April 1993)] Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium - Partial scan testing with single clock control

[IEEE Comput. Soc. Press Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium - Atlantic City, NJ, USA (6-8 April 1993)] Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium - Partial scan testing with single clock control

Agrawal, V.D.; Charkraborty, T.J.

作者Agrawal, V.D.; Charkraborty, T.J.
文件大小264.70KB
发表时间1993
DOI10.1109/vtest.1993.313365
页码313-315

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