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[IEEE Comput. Soc. Press 1993 IEEE 2nd Asian Test Symposium (ATS) - Beijing, China (16-18 Nov. 1993)] Proceedings of 1993 IEEE 2nd Asian Test Symposium (ATS) - A global BIST methodology

[IEEE Comput. Soc. Press 1993 IEEE 2nd Asian Test Symposium (ATS) - Beijing, China (16-18 Nov. 1993)] Proceedings of 1993 IEEE 2nd Asian Test Symposium (ATS) - A global BIST methodology

Gheewala, T.; Sucar, H.; Varma, P.

作者Gheewala, T.; Sucar, H.; Varma, P.
文件大小719.26KB
发表时间1993
DOI10.1109/ats.1993.398795
页码154-159

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