Design of a self-testing and self-repairing structure for highly hierarchical ultra-large capacity memory chips
- 期刊名称IEEE Transactions on Very Large Scale Integration (VLSI) Systems
- 作者Chen, T.; Sunada, G.
- 卷第1卷
- 期第2期
- 印刷ISSN1063-8210
- 文件大小978.75KB
- 发表时间1993-6
- DOI10.1109/92.238427
- 页码88-97
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