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Variable growth modes of CaF2 on Si(111) determined by x-ray photoelectron diffraction

Variable growth modes of CaF2 on Si(111) determined by x-ray photoelectron diffraction

Denlinger, J. D.; Rotenberg, Eli; Hessinger, Uwe; Leskovar, M.; Olmstead, Marjorie A.
  • 期刊名称Applied Physics Letters
  • 作者Denlinger, J. D.; Rotenberg, Eli; Hessinger, Uwe; Leskovar, M.; Olmstead, Marjorie A.
  • 卷第62卷
  • 期第17期
  • 印刷ISSN0003-6951
  • 文件大小638.00KB
  • 发表时间1993
  • DOI10.1063/1.109478
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