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[IEEE Comput. Soc. Press 1993 IEEE 2nd Asian Test Symposium (ATS) - Beijing, China (16-18 Nov. 1993)] Proceedings of 1993 IEEE 2nd Asian Test Symposium (ATS) - Fault modelisation of external shorts in CMOS circuits

[IEEE Comput. Soc. Press 1993 IEEE 2nd Asian Test Symposium (ATS) - Beijing, China (16-18 Nov. 1993)] Proceedings of 1993 IEEE 2nd Asian Test Symposium (ATS) - Fault modelisation of external shorts in CMOS circuits

Renovell, M.; Huc, P.; Bertrand, Y.

作者Renovell, M.; Huc, P.; Bertrand, Y.
文件大小557.99KB
发表时间1993
DOI10.1109/ats.1993.398811
页码237-242

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