SPIE Proceedings [SPIE San Diego '92 - San Diego, CA (Sunday 19 July 1992)] Multilayer and Grazing Incidence X-Ray/EUV Optics for Astronomy and Projection Lithography - Imaging Schwarzschild multilayer x-ray microscope
- 作者Hoover, Richard B.; Baker, Phillip C.; Shealy, David L.; Gore, David B.; Walker II, Arthur B. C.; Barbee, Jr., Troy W.; Kerstetter, Ted; Hoover, Richard B.; Walker II, Arthur B. C.
- 卷第1742卷
- 印刷ISSN0277-786X
- 文件大小831.48KB
- 发表时间1993
- DOI10.1117/12.140596
- 页码660-673
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