SPIE Proceedings [SPIE OE/LASE'93: Optics, Electro-Optics, & Laser Applications in Science& Engineering - Los Angeles, CA (Sunday 17 January 1993)] Scanning Probe Microscopies II - Thermal imaging of electronic materials and devices using the Atomic Force Microscope

Majumdar, Arun; Carrejo, J. P.; Lai, J.; Chandrachood, M.; Williams, Clayton C.

作者Majumdar, Arun; Carrejo, J. P.; Lai, J.; Chandrachood, M.; Williams, Clayton C.
卷第1855卷
印刷ISSN0277-786X
文件大小724.75KB
发表时间1993
DOI10.1117/12.146380
页码209-217

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