Characterization of the creep exposed CMSX2 single crystal by neutron diffraction topography and neutron diffractometry
- 作者P. Strunz; P. Lukáš; P. Mikula; J. Šaroun; G. Albertini; F. Rustichelli; G. Cicognani; A. Di Gianfrancesco
- 卷第44卷
- 期第7期
- 印刷ISSN0011-4626
- 电子ISSN1572-9486
- 文件大小428.04KB
- 发表时间1994-07
- DOI10.1007/bf01694839
- 页码687-693
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