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Carbon-doped InGaP/GaAs/InGaP double heterojunction bipolar transistors with a very low 1/f noise corner frequency of 108 kHz grown by chemical beam epitaxy

Carbon-doped InGaP/GaAs/InGaP double heterojunction bipolar transistors with a very low 1/f noise corner frequency of 108 kHz grown by chemical beam epitaxy

Y.K. Chen; R. Kapre; W.T. Tsang; A. Tate; D.A. Humphrey; L. Fan
  • 作者Y.K. Chen; R. Kapre; W.T. Tsang; A. Tate; D.A. Humphrey; L. Fan
  • 卷第136卷
  • 印刷ISSN0022-0248
  • 文件大小289.17KB
  • 发表时间1994
  • DOI10.1016/0022-0248(94)90413-8
  • 页码221-224
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