Testing Goes Critical Path
- 期刊名称AT&T Technical Journal
- 作者Campbell, Richard L.; Tarbox, Richard A.
- 卷第73卷
- 期第2期
- 印刷ISSN8756-2324
- 文件大小2426.60KB
- 发表时间1994-03-04
- DOI10.1002/j.1538-7305.1994.tb00573.x
- 页码4-9
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