[IEEE International Workshop on Numerical Modeling of processes and Devices for Integrated Circuits: NUPAD V - Honolulu, HI, USA (5-6 June 1994)] Proceedings of International Workshop on Numerical Modeling of processes and Devices for Integrated Circuits: NUPAD V - Further improvements in decoupled methods for semiconductor device modeling
Obrecht, M.S.; Heasell, E.L.; Elmasry, M.I.; Wu, K.-C.; Dutton, R.W.
- 作者Obrecht, M.S.; Heasell, E.L.; Elmasry, M.I.; Wu, K.-C.; Dutton, R.W.
- 文件大小243.63KB
- 发表时间1994
- DOI10.1109/nupad.1994.343474
- 页码129-132