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[IEEE International Conference on Multichip Modules - Denver, CO (April 13-15, 1994)] Proceedings of the International Conference on Multichip Modules - Algorithmic Diagnosis of Multichip Module Defects Using the IEEE 1149.1 Standard

[IEEE International Conference on Multichip Modules - Denver, CO (April 13-15, 1994)] Proceedings of the International Conference on Multichip Modules - Algorithmic Diagnosis of Multichip Module Defects Using the IEEE 1149.1 Standard

Posse, K.

作者Posse, K.
文件大小469.67KB
发表时间1994
DOI10.1109/icmcm.1994.753551
页码199-204

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