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SPIE Proceedings [SPIE SPIE's 1993 International Symposium on Optics, Imaging, and Instrumentation - San Diego, CA (Sunday 11 July 1993)] X-Ray and Ultraviolet Polarimetry - <title>Polarization characteristics of synchrotron radiation by means of rotating-analyzer ellipsometry using soft x-ray multilayer</title>

SPIE Proceedings [SPIE SPIE's 1993 International Symposium on Optics, Imaging, and Instrumentation - San Diego, CA (Sunday 11 July 1993)] X-Ray and Ultraviolet Polarimetry - Polarization characteristics of synchrotron radiation by means of rotating-analyzer ellipsometry using soft x-ray multilayer

Kimura, Hiroaki; Kinoshita, Toyohiko; Suzuki, Shyouzi; Miyahara, Tsuneaki; Yamamoto, Masaki; Fineschi, Silvano
  • 作者Kimura, Hiroaki; Kinoshita, Toyohiko; Suzuki, Shyouzi; Miyahara, Tsuneaki; Yamamoto, Masaki; Fineschi, Silvano
  • 卷第2010卷
  • 印刷ISSN0277-786X
  • 文件大小522.34KB
  • 发表时间1994
  • DOI10.1117/12.168588
  • 页码37-44
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