SPIE Proceedings [SPIE Photonics for Industrial Applications - Boston, MA (Monday 31 October 1994)] Machine Vision Applications, Architectures, and Systems Integration III - Detection of secondary reflections using morphology
- 作者Miller, John W. V.; Shabestari, Behrouz N.; Batchelor, Bruce G.; Solomon, Susan S.; Waltz, Frederick M.
- 卷第2347卷
- 印刷ISSN0277-786X
- 文件大小267.85KB
- 发表时间1994
- DOI10.1117/12.188741
- 页码301-306
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