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[IEEE Comput. Soc. Press 13th IEEE VLSI Test Symposium - Princeton, NJ, USA (30 April-3 May 1995)] Proceedings 13th IEEE VLSI Test Symposium - Improving the efficiency of error identification via signature analysis

[IEEE Comput. Soc. Press 13th IEEE VLSI Test Symposium - Princeton, NJ, USA (30 April-3 May 1995)] Proceedings 13th IEEE VLSI Test Symposium - Improving the efficiency of error identification via signature analysis

Stroud, C.E.; Damarla, T.R.

作者Stroud, C.E.; Damarla, T.R.
文件大小595.97KB
发表时间1995
DOI10.1109/vtest.1995.512644
页码244-249

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