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[IEEE Comput. Soc. Press 13th IEEE VLSI Test Symposium - Princeton, NJ, USA (30 April-3 May 1995)] Proceedings 13th IEEE VLSI Test Symposium - The concept of resistance interval: a new parametric model for realistic resistive bridging fault

[IEEE Comput. Soc. Press 13th IEEE VLSI Test Symposium - Princeton, NJ, USA (30 April-3 May 1995)] Proceedings 13th IEEE VLSI Test Symposium - The concept of resistance interval: a new parametric model for realistic resistive bridging fault

Renovell, M.; Huc, P.; Bertrand, Y.

作者Renovell, M.; Huc, P.; Bertrand, Y.
文件大小620.94KB
发表时间1995
DOI10.1109/vtest.1995.512635
页码184-189

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