[IEEE 1995 53rd Annual Device Research Conference Digest - Charlottesville, VA, USA (19-21 June 1995)] 1995 53rd Annual Device Research Conference Digest - Nano electronic modelling (NEMO)
- 作者Klimeck, G.; Lake, R.; Bowen, R.C.; Frensley, W.R.; Blanks, D.
- 文件大小237.33KB
- 发表时间1995
- DOI10.1109/drc.1995.496267
- 页码52-53
Cover 1 (Outside Front Cover) and Cover 2 (Inside Front Cover)Plastics Engineering · 2019
Cover 1 (Outside Front Cover) and Cover 2 (Inside Front Cover)Plastics Engineering · 2019
Cover 1 (Outside Front Cover) and Cover 2 (Inside Front Cover)Plastics Engineering · 2020
Cover 1 (Outside Front Cover) and Cover 2 (Inside Front Cover)Plastics Engineering · 2020
Front cover - IEEE Nanotechnology Magazine - Front cover2008
Front cover - IEEE Nanotechnology Magazine - Front cover2008
Front cover - IEEE Nanotechnology Magazine - Front cover2008
Front cover - IEEE Communications Magazine - Front cover2007
The gravimetric determination of germaniumDavies, Glyn Rees; Morgan, Gilbert · The Analyst · 1938
NotesHeadridge, J. B.; Taylor, M. S.; Bloxam, T. W. · The Analyst · 1962
Thermal lens spectrometry. A reviewSnook, Richard D.; Lowe, Roger D. · The Analyst · 1995
Fluorescence spectrometry. A reviewParker, C. A.; Rees, W. T. · The Analyst · 1962
Biochemically functionalized silica nanoparticlesQhobosheane, Monde; Santra, Swadeshmukul; Zhang, Peng; Tan, Weihong · The Analyst · 2001
Printing conducting polymersWeng, B.; Shepherd, R. L.; Crowley, K.; Killard, A. J.; Wallace, G. G. · The Analyst · 2010
A new test for ‘sufficient homogeneity’Fearn, Tom; Thompson, Michael · The Analyst · 2001
Standard additions: myth and realityEllison, Stephen L. R.; Thompson, Michael · The Analyst · 2008