Hierarchical cluster analysis for exposure assessment of workers in the semiconductor health study
- 作者Cynthia J. Hines; Steve Selvin; Steven J. Samuels; S. Katharine Hammond; Susan R. Woskie; Marilyn F. Hallock; Marc B. Schenker
- 卷第28卷
- 期第6期
- 印刷ISSN0271-3586
- 电子ISSN1097-0274
- 文件大小566.98KB
- 发表时间1995
- DOI10.1002/ajim.4700280607
- 页码713-722