[IEEE International Conference on Microelectronic Test Structures - Nara, Japan (22-25 March 1995)] Proceedings International Conference on Microelectronic Test Structures - Statistics for matching
Pergoot, A.; Graindourze, B.; Janssens, E.; Bastos, J.; Steyaert, M.; Kinget, P.; Roovers, R.; Sansen, W.
- 作者Pergoot, A.; Graindourze, B.; Janssens, E.; Bastos, J.; Steyaert, M.; Kinget, P.; Roovers, R.; Sansen, W.
- 文件大小298.87KB
- 发表时间1995
- DOI10.1109/icmts.1995.513971
- 页码193-197