[IEEE Comput. Soc. Press 8th International Conference on VLSI Design - New Delhi, India (4-7 Jan. 1995)] Proceedings of the 8th International Conference on VLSI Design - Efficient multisine testing of analog circuits
Nagi, N.; Chatterjee, A.; Balivada, A.; Abraham, J.A.
- 作者Nagi, N.; Chatterjee, A.; Balivada, A.; Abraham, J.A.
- 文件大小467.74KB
- 发表时间1995
- DOI10.1109/icvd.1995.512115
- 页码234-238