Study of deep hole and electron traps in nitrogen-doped ZnSe by isothermal capacitance transient spectroscopy and deep level transient spectroscopy

• 期刊名称Applied Physics Letters
• 作者Tanaka, Kiyotake; Zhu, Ziqiang; Yao, Takafumi
• 卷第66卷
• 期第24期
• 印刷ISSN0003-6951
• 文件大小333.33KB
• 发表时间1995
• DOI10.1063/1.113753