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[Int. Test Conference 1995 IEEE International Test Conference (ITC) - Washington, DC, USA (21-25 Oct. 1995)] Proceedings of 1995 IEEE International Test Conference (ITC) - An effective BIST scheme for Booth multipliers

[Int. Test Conference 1995 IEEE International Test Conference (ITC) - Washington, DC, USA (21-25 Oct. 1995)] Proceedings of 1995 IEEE International Test Conference (ITC) - An effective BIST scheme for Booth multipliers

Gizopoulos, D.; Paschalis, A.; Zorian, Y.

作者Gizopoulos, D.; Paschalis, A.; Zorian, Y.
文件大小1073.34KB
发表时间1995
DOI10.1109/test.1995.529914
页码824-833

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