[IEEE 1995 IEEE MTT-S International Microwave Symposium - Orlando, FL, USA (16-20 May 1995)] Proceedings of 1995 IEEE MTT-S International Microwave Symposium - 2D electro-optic probing combined with field theory based multimode wave amplitude extraction: a new approach to on-wafer measurement
David, G.; Schroeder, W.; Jager, D.; Wolff, I.
- 作者David, G.; Schroeder, W.; Jager, D.; Wolff, I.
- 文件大小346.74KB
- 发表时间1995
- DOI10.1109/mwsym.1995.406152
- 页码1049-1052