发现好书期刊，享受阅读乐趣

海量图书期刊资源，随时随地畅享阅读乐趣

[IEEE 1995 Proceedings. 45th Electronic Components and Technology Conference - Las Vegas, NV, USA (21-24 May 1995)] 1995 Proceedings. 45th Electronic Components and Technology Conference - Improved approximations for structural reliability in thermal analysis

[IEEE 1995 Proceedings. 45th Electronic Components and Technology Conference - Las Vegas, NV, USA (21-24 May 1995)] 1995 Proceedings. 45th Electronic Components and Technology Conference - Improved approximations for structural reliability in thermal analysis

Jensen, H.; Cifuentes, A.O.

作者Jensen, H.; Cifuentes, A.O.
文件大小630.73KB
发表时间1995
DOI10.1109/ectc.1995.517836
页码1152-1160

← 返回【学霸图书馆】主页