Surface-science aspects of vacuum microelectronics
- 作者P. R. Schwoebel
- 文件大小1583.75KB
- 发表时间1995
- DOI10.1116/1.588219
Secondary electron emission studiesA. Shih; J. Yater; C. Hor; R. Abrams · 1997
Preparation of transmission electron microscopy cross sections using nanofabrication techniquesYater, J. A. · Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures · 1992
Secondary electron emission characteristics of single-crystal and polycrystalline diamondYater, J. E.; Shih, A. · Journal of Applied Physics · 2000
Application of a general electron emission equation to surface nonuniformity and current density variationK. L. Jensen; J. J. Petillo; E. J. Montgomery; Z. Pan; D. W. Feldman; P. G. O’shea; N. A. Moody; M. Cahay; J. E. Yater; J. L. Shaw · 2008
Slow relaxation of excited states in strain-induced quantum dotsGfroerer, T. H.; Sturge, M. D.; Kash, K.; Yater, J. A.; Plaut, A. S.; Lin, P. S. D.; Florez, L. T.; Harbison, J. P.; Das, S. R.; Lebrun, L. · Physical Review B · 1996
Secondary electron emission characteristics of C(111) and the observation of double-peaked emission spectraYater, J. E.; Shih, A. · Journal of Applied Physics · 2001
[IEEE 2010 8th International Vacuum Electron Sources Conference and Nanocarbon (IVESC) - Nanjing, China (2010.10.14-2010.10.16)] 2010 8th International Vacuum Electron Sources Conference and Nanocarbon - Characterization of electron bunches from a diamond current amplifierJensen, K. L.; Yater, J. E.; Shaw, J. L.; Pasour, J. A. · 2010