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SPIE Proceedings [SPIE IS&T/SPIE's Symposium on Electronic Imaging: Science & Technology - San Jose, CA (Sunday 5 February 1995)] Machine Vision Applications in Industrial Inspection III - <title>Development of color-vision-based solutions for lumber grading</title>

SPIE Proceedings [SPIE IS&T/SPIE's Symposium on Electronic Imaging: Science & Technology - San Jose, CA (Sunday 5 February 1995)] Machine Vision Applications in Industrial Inspection III - Development of color-vision-based solutions for lumber grading

Kauppinen, Hannu; Silven, Olli; Wu, Frederick Y.; Wilson, Stephen S.

作者Kauppinen, Hannu; Silven, Olli; Wu, Frederick Y.; Wilson, Stephen S.
卷第2423卷
印刷ISSN0277-786X
文件大小896.85KB
发表时间1995
DOI10.1117/12.205507
页码203-214

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