[IEEE Proceedings IEEE Micro Electro Mechanical Systems. 1995 - Amsterdam, Netherlands (1995.01.29-1995.02.2)] Proceedings IEEE Micro Electro Mechanical Systems 1995 MEMSYS-95 - Proceedings IEEE Micro Electro Mechanical Systems. 1995
- 文件大小24.34KB
- 发表时间1995
- DOI10.1109/memsys.1995.472609
myIEEEIEEE Transactions on Geoscience and Remote Sensing · 2013
myIEEEIEEE Transactions on Semiconductor Manufacturing · 2014
myIEEEIEEE Transactions on Systems, Man, and Cybernetics: Systems · 2014
myIEEEIEEE Transactions on Systems, Man, and Cybernetics: Systems · 2014
MyIEEEIEEE Transactions on Industrial Electronics · 2014
myIEEEIEEE Transactions on Geoscience and Remote Sensing · 2014
myIEEEIEEE Transactions on Geoscience and Remote Sensing · 2014
myIEEEIEEE Transactions on Geoscience and Remote Sensing · 2014
Digitally intensive wireless transceiversStaszewski, Robert Bogdan · IEEE Design & Test of Computers · 2012
Test Challenges for 3D Integrated CircuitsLee, Hsien-Hsin; Chakrabarty, Krishnendu · IEEE Design & Test · 2013
Adaptive Alternate Analog TestStratigopoulos, Haralampos-G.; Mir, Salvador · IEEE Design & Test of Computers · 2012
The Olympus synthesis systemDe Micheli, G.; Ku, D.; Mailhot, F.; Truong, T. · IEEE Design & Test of Computers · 1990
Clock system designWagner, K.D. · IEEE Design & Test of Computers · 1988
Alpha 21164 testability strategyBhavsar, D.K.; Edmondson, J.H. · IEEE Design & Test of Computers · 1997
Automatic generation of parallel CRC circuitsSprachmann, M. · IEEE Design & Test of Computers · 2001
Automated BIST for sequential logic synthesisStroud, C.E. · IEEE Design & Test of Computers · 1988