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The behavior of the surface charge density in HgxCd1−xTe epilayers due to hydrogenation and annealing

The behavior of the surface charge density in HgxCd1−xTe epilayers due to hydrogenation and annealing

M.S. Han; J.H. Beak; Y.T. Oh; T.W. Kang; T.W. Kim; Jung In Choi

作者M.S. Han; J.H. Beak; Y.T. Oh; T.W. Kang; T.W. Kim; Jung In Choi
卷第103卷
期第2期
印刷ISSN0169-4332
文件大小413.93KB
发表时间1996
DOI10.1016/0169-4332(96)00473-4
页码183-187

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