[IEEE Comput. Soc. Press European Design and Test Conference - Paris, France (11-14 March 1996)] Proceedings ED&TC European Design and Test Conference - Surprises in sequential redundancy identification
- 作者Iyer, M.A.; Long, D.E.; Abramovici, M.
- 文件大小716.26KB
- 发表时间1996
- DOI10.1109/edtc.1996.494131
- 页码88-94
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