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[IEEE Ninth Annual IEEE International ASIC Conference and Exhibit - Rochester, NY, USA (23-27 Sept. 1996)] Proceedings Ninth Annual IEEE International ASIC Conference and Exhibit - Efficient error bit identification from failing signatures

[IEEE Ninth Annual IEEE International ASIC Conference and Exhibit - Rochester, NY, USA (23-27 Sept. 1996)] Proceedings Ninth Annual IEEE International ASIC Conference and Exhibit - Efficient error bit identification from failing signatures

Stroud, C.E.; Damarla, T.R.

作者Stroud, C.E.; Damarla, T.R.
文件大小517.56KB
发表时间1996
DOI10.1109/asic.1996.552006
页码259-262

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