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[IEEE Conference Record. AUTOTESTCON '96 - Dayton, OH, USA (16-19 Sept. 1996)] Conference Record. AUTOTESTCON '96 - Register size vs. fault coverage in modified circular built-in self-test

[IEEE Conference Record. AUTOTESTCON '96 - Dayton, OH, USA (16-19 Sept. 1996)] Conference Record. AUTOTESTCON '96 - Register size vs. fault coverage in modified circular built-in self-test

Stroud, C.E.; Ping He, ; Damarla, T.R.

作者Stroud, C.E.; Ping He, ; Damarla, T.R.
文件大小650.49KB
发表时间1996
DOI10.1109/autest.1996.547672
页码23-28

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