[Int. Test Conference International Test Conference 1996. Test and Design Validity - Washington, DC, USA (20-25 Oct. 1996)] Proceedings International Test Conference 1996. Test and Design Validity - Test generation for ultra-large circuits using ATPG constraints and test-pattern templates
- 作者Wohl, P.; Waicukauski, J.
- 文件大小878.13KB
- 发表时间1996
- DOI10.1109/test.1996.556938
- 页码13-20
[IEEE 2007 2nd IEEE International Symposium on New Frontiers in Dynamic Spectrum Access Networks - Dublin, Ireland (2007.04.17-2007.04.20)] 2007 2nd IEEE International Symposium on New Frontiers in Dynamic Spectrum Access Networks - Sponsors - DYSPAN 20072007
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