[IEEE 1996 IEEE Hong Kong Electron Devices Meeting - Hong Kong (29 June 1996)] Proceedings 1996 IEEE Hong Kong Electron Devices Meeting - Recent advances in Si/SiGe HBT research
Schwierz, F.; Rossberg, M.; Forster, H.; Nuernbergk, D.; Schipanski, D.
- 作者Schwierz, F.; Rossberg, M.; Forster, H.; Nuernbergk, D.; Schipanski, D.
- 文件大小255.57KB
- 发表时间1996
- DOI10.1109/hkedm.1996.566292
- 页码1-4