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Pyroelectric current method for measuring ferroelectric memory cell retention at high temperatures

Pyroelectric current method for measuring ferroelectric memory cell retention at high temperatures

Lin, H.; Zomorrodian, A. R.; Wu, N. J.; Huang, T. Q.; Liu, D.; Ignatiev, A.

期刊名称Integrated Ferroelectrics
作者Lin, H.; Zomorrodian, A. R.; Wu, N. J.; Huang, T. Q.; Liu, D.; Ignatiev, A.
卷第12卷
期第1期
印刷ISSN1058-4587
电子ISSN1607-8489
文件大小330.33KB
发表时间1996-06
DOI10.1080/10584589608225747
页码47-52

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